Scanning Electron Microscopes

Both microscopes have CryoSEM systems fitted

 FEI NOVA nanoSEM Field Emmission SEM

 


Major Features of this high-resolution instrument are:

 High vacuum imaging
     o    Everhart Thornley detector (ETD): routine imaging
     o    Through-the-Lens detector (TLD): high magnification/resolution

Low vacuum imaging:

     o    Low vacuum detector (LVD)-lower  magnifications
     o    Helix detector (Helix)-high magnification/resolution
 Back-scattering imaging using the Gaseous Analytical Detector (GAD)
     o    High vacuum and low vacuum

 
STEM detector: for very thin samples and high vacuum only
Cryo imaging utilizing the GATAN Alto 2500 cryo system
Elemental Analysis utilizing Electron Dispersive X-ray analysis (EDX)
     o    Oxford INCA Energy 250 system with 30mm window 

FEI Quanta 3D FEG Dual-beam SEM

 

quanta_small.jpg

Major Features:
Dual-beam instrument having both an electron beam and a gallium ion beam. The electron beam is used for imaging and the gallium beam is used for site specific milling, machining and deposition.

 
High Vacuum imaging
  Everhart-Thornley Detector (ETD)

 
Low vacuum imaging 
    Permanently installed low vacuum detector (LVD)
 
True environmental imaging: to 100% humidity in sample chamber
     500µm gaseous secondary electron detector (GSED)
    1000µm gaseous secondary electron detector (GSED)
     Peltier stage for heating and cooling

 
Elemental Analysis utilizing Electron Dispersive X-ray analysis (EDX)
     o    Oxford INCA Xstream-2 silicon drift detector with Xmax80 window

 
Cryo imaging utilizing the GATAN Alto 2500 cryo system

 
GATAN Low Force tensile stage:
     200, 20, and 2-newton load cells
     Tension or compression/peltier cooling & heating
     Incorporated cryo holder for transfer to cryo chamber without release of tension for cryo dual-beam ablation/imaging
 
 

 
 GATAN Alto 2500 Cryo Units

GATAN Alto 2500 Cryo Units


 
The cryo systems on the NOVA nanoSEM and the Quanta 3D FEG microscopes are optomized for use on field-emission microscopes. They consist of a freezing unit, a turbo-pumped cryo preparation unit, and a cryo stage that attaches to the microscope stage. The cryo system permits flash freezing of samples in liquid nitrogen slush followed by high vacuum sublimation of unbound water, Pt coating to minimize charge build-up and imaging at temperatures down to ~160C.

 

 

 

 

 

 

 
 
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