EQUIPMENT

Themis Z Abberation-Corrected (s)TEM (BRK 1269)

Themis Z (BRK 1269)

 

Major Features of this high-resolution instrument are:

imaging:

  • 60 - 300 kV monochromated field emission electron gun.
  • Probe and image aberration corrected.
  • Atomic resolution in both TEM and STEM with resolution of <65 pm at 300 kV.
  • Scanning TEM (STEM).
  • Single tilt and double tilt holder available.  

Energy Dispersive X-ray (EDX) Spectroscopy

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements at or above atomic number 5.  
  • Quad-silicon drift detector (Super-X).
  • EDX spectral mapping down to the atomic scale.

Electron Energy Loss Spectroscopy (EELS)

  • EELS provides bonding and oxidation state information.
  • Gatan Quantum 965 Detector.

Integrated differential Phase contrast (IDpc)

  • IDPC allows light element detection in STEM.

Electron Tomography

  • 3D reconstruction via tilt series image collection.
  • 3D imaging and 3D elemental composition.  

 

Talos 200i (S)TEM (ARMS B205)

Talos 200i ARMS B205

 

 

Tecnai G2 20 TEM (WSLR S042)

tecnai640.jpg

 

imaging:

  • 200 KV LaB6 filament electron gun.
  • Bottom mount Gatan US1000 2Kx2K.
  • Single tilt holder and low background double tilt holder available.  

Energy Dispersive X-ray (EDX) Spectroscopy

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements at or above atomic number 5.  
  • Oxford Instruments X-MAX SDD EDX detector
  • Point analysis.

Electron Tomography

  • 3D reconstruction via tilt series image collection.

 

Tecnai 12 TEM (WSLR S046)

tecnai-t12-wslr-s046

Major Features of this high-resolution instrument are:

imaging:

  • 120 kV tungsten filament electron gun (typically operated at 80 kV for high contrast in bioogical samples). 
  • Side-mount wide-angle CCD camera. 

Apreo 2s FEG (WSLR S044)

apreo 2s wslr s044

Major Features of this high-resolution instrument are:

imaging:

  • Three modes of high vacuum operation allow high resolution imaging of a wide range of conductive or coated materials.
  • Low vacuum detectors allow imaging of uncoated non-conductive samples. 
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 
  • Automated image stitching enables collection of large area maps at high resolution. 

Electron Channelling Contrast Imaging (ECCI) and Electron Channelling Pattern (ECP):

  • ECCI allows image collection with crystallographic contrast to observe crystalline grains and detect dislocations. 
  • ECP employs a rocking electron beam to produce Kikuchi patterns. 

Cryo-SEM

  • Loading frozen samples and keeping them frozen throughout imaging allows SEM images to be acquired of hydrated samples, aqueous suspensions, and materials containing volatiles. 
  • Imaging at low temperatures can reduce sample damage for beam-sensitive materials and reduce heat-related sample movement. 

Energy Dispersive X-ray (EDX) Spectroscopy

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements above atomic number 5.  
  • Single point analysis or area mapping is available.  

 

 

Helios G4 UX FEG Dual Beam (BRK 1237)

helios-g4-ux-dual-beam-brk1237

Major Features of this high-resolution instrument are:

imaging:

  • Two modes of high vacuum operation allow high resolution imaging of a wide range of conductive or coated materials.
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 
  • Automated image stitching enables collection of large area maps at high resolution. 

Focussed Ion Beam (FIB):

  • Gallium FIB for site specific milling, machining, deposition, and lamella prep.  

Electron backscatter Diffraction (EBSD):

  • Analysis of crystalline material to analyze grain size and orientation. 

Energy Dispersive X-ray (EDX) Spectroscopy:

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements above atomic number 5.  
  • Single point analysis or area mapping is available.  

Scanning Transmission EM (STEM):

  • STEM allows analysis of very thin samples. 

 

Teneo Volumescope FEG (WSLR S050)

teneo volumescope

Major Features of this high-resolution instrument are:

imaging:

  • Two modes of high vacuum operation allow high resolution imaging of a wide range of conductive or coated materials.
  • Low vacuum detectors allow imaging of uncoated non-conductive samples. 
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 
  • Automated image stitching enables collection of large area maps at high resolution. 

serial block face imaging:

  • Serial sectioning is performed using an in-situ ultramicrotome. 

Scanning Transmission EM (STEM):

  • STEM allows analysis of very thin samples. 

 

Quanta 3D FEG Dual-beam SEM (WSLR S048)

quanta_small.jpg

Major Features of this instrument are:

imaging:

  • High vacuum operation allows imaging of a wide range of conductive or coated materials.
  • Low vacuum detectors allow imaging of uncoated non-conductive samples. 
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 

Energy Dispersive X-ray (EDX) Spectroscopy

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements above atomic number 5.  
  • Single point analysis or area mapping is available.  

Focussed Ion Beam (FIB)

  • Gallium FIB for site specific milling, machining, deposition, and lamella prep.  

Full Environmental SEM (ESEM)

  • ESEM allows controlled changes in humidity up to 100% RH with simultaneous SEM imaging. 

 

Quanta 650 FEG (ARMS B218)

Quanta 650 ARMS B218

Major Features of this instrument are:

imaging:

  • High vacuum operation allows imaging of a wide range of conductive or coated materials.
  • Low vacuum detectors allow imaging of uncoated non-conductive samples. 
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 

Energy Dispersive X-ray (EDX) Spectroscopy:

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements above atomic number 5.  
  • Single point analysis or area mapping is available.  

Electron backscatter Diffraction (EBSD):

  • Analysis of crystalline material to analyze grain size and orientation. 

 

Apreo s FEG (BRK Cleanroom n-bay)

apreo-s-birck-cleanroom-n-bay

Major Features of this high-resolution instrument are:

imaging:

  • Two modes of high vacuum operation allow high resolution imaging of a wide range of conductive or coated materials.
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 
  • Automated image stitching enables collection of large area maps at high resolution. 

 

 

Hitachi S-4800 FEG (BRK 1235)

hitachi-s-4800-field-emission-sem-brk-1235

Major Features of this instrument are:

imaging:

  • High vacuum operation allows imaging of a wide range of conductive or coated materials.
  • Multiple detectors are available to allow imaging with contrast based on surface topography or average atomic number. 

Energy Dispersive X-ray (EDX) Spectroscopy:

  • EDX spectroscopy (also known as EDS) allows elemental composition analysis of elements above atomic number 5.  
  • Single point analysis or area mapping is available.  

  • Pelco Oven for Microwave fixation
  • Pelco easiSlicer Vibratome
  • ​Reichert Ultracut E ultramicrotomes 
​Leica UC6 Ultramicrotome ​Leica UC6 Ultramicrotome

Pelco EasiglowPelco Easiglow​

Cressington turbo-pumped sputter coater​Cressington turbo-pumped sputter coater

tousimis.jpgTousimis 931 CPD​

 

FEI NOVA nanoSEM Field Emission SEM

FEI NOVA nanoSEM Field Emission SEM

Major Features of this high-resolution instrument are:

High vacuum imaging:

  • Everhart Thornley detector (ETD): routine imaging
  • Through-the-Lens detector (TLD): high magnification/resolution

Low vacuum imaging:

  • Low vacuum detector (LVD)-lower magnifications
  • Helix detector (Helix)-high magnification/resolution

Back-scattering imaging using the Gaseous Analytical Detector (GAD):

  • High vacuum and low vacuum

STEM detector:

For very thin samples and high vacuum only Cryo imaging utilizing the GATAN Alto 2500 cryo system Elemental Analysis utilizing Electron Dispersive X-ray analysis (EDX)

  • Oxford INCA Energy 250 system with 30mm window

FEI/Philips CM-100 Transmission Electron Microscope

FEI/Philips CM-100 Transmission Electron MicroscopeFEI/Philips CM-100 Transmission Electron Microscope

The CM-100 is a basic TEM and has a magnification range from 20x to 510,000 and accelerating voltage from 40 to 100kV.

Special Features:
Low-dose for automatic shift to new area after focusing or focusing on same are but with low beam intensity to minimize beam damage prior to recording.
Specimen relocation system. Gatan Orius side mount CCD camera

  • 30mm window

GATAN Alto 2500 Cryo UnitsGATAN Alto 2500 Cryo Units

The cryo systems on the NOVA nanoSEM and the Quanta 3D FEG microscopes are optimized for use on field-emission microscopes. They consist of a freezing unit, a turbo-pumped cryo preparation unit, and a cryo stage that attaches to the microscope stage. The cryo system permits flash freezing of samples in liquid nitrogen slush followed by high vacuum sublimation of unbound water, Pt coating to minimize charge build-up and imaging at temperatures down to ~160C.